{"title":"ITC2003改进无线产品测试:大学和行业合作的机会","authors":"J. Paviol","doi":"10.1109/TEST.2003.1271129","DOIUrl":null,"url":null,"abstract":"Intersil Corporation – Wireless Division has used University R&D in the past to generate ideas for WAT PCM level self-testing with some success, but has not yet capitalized on all the opportunities possible through university collaborations. Generally the design R&D area has generated the largest payback with new theory, measurement techniques or calibrations, and circuit topology or ideas as the main areas of University – Industry teamwork.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"ITC2003 improving wireless product testing: an opportunity for university and industry collaboration\",\"authors\":\"J. Paviol\",\"doi\":\"10.1109/TEST.2003.1271129\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Intersil Corporation – Wireless Division has used University R&D in the past to generate ideas for WAT PCM level self-testing with some success, but has not yet capitalized on all the opportunities possible through university collaborations. Generally the design R&D area has generated the largest payback with new theory, measurement techniques or calibrations, and circuit topology or ideas as the main areas of University – Industry teamwork.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1271129\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1271129","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
ITC2003 improving wireless product testing: an opportunity for university and industry collaboration
Intersil Corporation – Wireless Division has used University R&D in the past to generate ideas for WAT PCM level self-testing with some success, but has not yet capitalized on all the opportunities possible through university collaborations. Generally the design R&D area has generated the largest payback with new theory, measurement techniques or calibrations, and circuit topology or ideas as the main areas of University – Industry teamwork.
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