{"title":"波形记录仪的阶跃和频响测试","authors":"T. Souders, D. R. Flach, J. Blair","doi":"10.1109/IMTC.1990.66001","DOIUrl":null,"url":null,"abstract":"Tutorial material is presented to aid in measuring the step response of waveform recorders and in computing other parameters which may be derived from the step response. Parameters considered include impulse response, transition duration, settling time, and complex frequency response. The measurement approaches follow those recommended in the IEEE Trial Use Standard for digitizing waveform recorders. Illustration examples are given, and guidelines on the choice of step generators are included.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Step and frequency response testing of waveform recorders\",\"authors\":\"T. Souders, D. R. Flach, J. Blair\",\"doi\":\"10.1109/IMTC.1990.66001\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Tutorial material is presented to aid in measuring the step response of waveform recorders and in computing other parameters which may be derived from the step response. Parameters considered include impulse response, transition duration, settling time, and complex frequency response. The measurement approaches follow those recommended in the IEEE Trial Use Standard for digitizing waveform recorders. Illustration examples are given, and guidelines on the choice of step generators are included.<<ETX>>\",\"PeriodicalId\":404761,\"journal\":{\"name\":\"7th IEEE Conference on Instrumentation and Measurement Technology\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"7th IEEE Conference on Instrumentation and Measurement Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1990.66001\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th IEEE Conference on Instrumentation and Measurement Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1990.66001","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Step and frequency response testing of waveform recorders
Tutorial material is presented to aid in measuring the step response of waveform recorders and in computing other parameters which may be derived from the step response. Parameters considered include impulse response, transition duration, settling time, and complex frequency response. The measurement approaches follow those recommended in the IEEE Trial Use Standard for digitizing waveform recorders. Illustration examples are given, and guidelines on the choice of step generators are included.<>