P. Mercier, S. R. Singh, K. Iniewski, B. Moore, P. O'Shea
{"title":"三维芯片堆叠技术的成品率和成本建模","authors":"P. Mercier, S. R. Singh, K. Iniewski, B. Moore, P. O'Shea","doi":"10.1109/CICC.2006.320948","DOIUrl":null,"url":null,"abstract":"It has been shown that stacking a set of known good dice into a 3D chip array may be beneficial in terms of system performance and footprint area. This paper demonstrates that, in the general sense, it is also beneficial to arrange chips into a 3D stack from yield and cost perspectives. It is shown that an optimal point occurs where cost is minimized by stacking an appropriate amount of dice into a single system","PeriodicalId":269854,"journal":{"name":"IEEE Custom Integrated Circuits Conference 2006","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"32","resultStr":"{\"title\":\"Yield and Cost Modeling for 3D Chip Stack Technologies\",\"authors\":\"P. Mercier, S. R. Singh, K. Iniewski, B. Moore, P. O'Shea\",\"doi\":\"10.1109/CICC.2006.320948\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It has been shown that stacking a set of known good dice into a 3D chip array may be beneficial in terms of system performance and footprint area. This paper demonstrates that, in the general sense, it is also beneficial to arrange chips into a 3D stack from yield and cost perspectives. It is shown that an optimal point occurs where cost is minimized by stacking an appropriate amount of dice into a single system\",\"PeriodicalId\":269854,\"journal\":{\"name\":\"IEEE Custom Integrated Circuits Conference 2006\",\"volume\":\"55 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"32\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Custom Integrated Circuits Conference 2006\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2006.320948\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Custom Integrated Circuits Conference 2006","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2006.320948","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Yield and Cost Modeling for 3D Chip Stack Technologies
It has been shown that stacking a set of known good dice into a 3D chip array may be beneficial in terms of system performance and footprint area. This paper demonstrates that, in the general sense, it is also beneficial to arrange chips into a 3D stack from yield and cost perspectives. It is shown that an optimal point occurs where cost is minimized by stacking an appropriate amount of dice into a single system