{"title":"内置1v中压传感器","authors":"Jing-Jou Tang","doi":"10.1109/APASIC.1999.824088","DOIUrl":null,"url":null,"abstract":"In this paper, a novel circuit design that can detect faults resulting in intermediate voltage values is presented. This design can also be used to detect slow transition faults and the metastability of a circuit under test. The power supply of this circuit is only 1 V. Thus it can be used for not only conventional circuits but also the low voltage (LV) circuits.","PeriodicalId":346808,"journal":{"name":"AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A 1 V built-in intermediate voltage sensor\",\"authors\":\"Jing-Jou Tang\",\"doi\":\"10.1109/APASIC.1999.824088\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a novel circuit design that can detect faults resulting in intermediate voltage values is presented. This design can also be used to detect slow transition faults and the metastability of a circuit under test. The power supply of this circuit is only 1 V. Thus it can be used for not only conventional circuits but also the low voltage (LV) circuits.\",\"PeriodicalId\":346808,\"journal\":{\"name\":\"AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360)\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-08-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APASIC.1999.824088\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APASIC.1999.824088","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper, a novel circuit design that can detect faults resulting in intermediate voltage values is presented. This design can also be used to detect slow transition faults and the metastability of a circuit under test. The power supply of this circuit is only 1 V. Thus it can be used for not only conventional circuits but also the low voltage (LV) circuits.