基于聚类的标准单元放置模拟退火

S. Mallela, Lov K. Grover
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引用次数: 56

摘要

作者提出了一种新颖的技术来减少模拟退火的有效问题大小而不影响解的质量。他们根据细胞的相互连接形成细胞簇,并使用传统的模拟退火技术将它们放在首位。然后,他们分解集群,并使用另一种模拟退火过程来放置单个细胞,该过程对放置进行了改进。因此,原始问题被分成两个子问题,每个子问题所需的时间都要少得多。这种两阶段模拟退火的结果优于传统的模拟退火实现,并且在更大的芯片上观察到更显着的改进。对于超过2500个单元的芯片,作者报告说,CPU时间的速度提高了2到3倍,同时估计的导线长度提高了6到17%。
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Clustering based simulated annealing for standard cell placement
The authors present a novel technique for reducing the effective problem size for simulated annealing without compromising the solution quality. They form clusters of cells based on their interconnections, and place them first using conventional simulated annealing. They then break up the clusters, and place the individual cells using another simulated annealing process that does a refinement on the placement. The original problem is thus divided into two subproblems, each requiring much less time. The results of this two-stage simulated annealing have been superior to those with a conventional simulated annealing implementation, with more significant improvements observed for larger chips. For chips with more than 2500 cells, the authors report a factor-of-two-to-three speed-up in CPU time, together with a 6-to-17% improvement in the estimated wire length.<>
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