P. Polak-Dingels, H. Hung, T. Smith, H. Huang, K. Webb, C.H. Lee
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On-wafer characterization of monolithic millimeter-wave integrated circuits by a picosecond optical electronic technique
A picosecond optical electronic sampling technique for the characterization of monolithic microwave integrated circuits (MMICs) has been developed. The measured time-domain response allows the spectral transfer function of the MMIC to be obtained. This technique was applied to characterize the frequency response of a two-stage Ka-band MMIC amplifier. The broadband results agree well with those obtained by conventional network analyzer measurements.<>
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