{"title":"存储设备的技术扩展挑战和机遇","authors":"Seok-Hee Lee","doi":"10.1109/IEDM.2016.7838026","DOIUrl":null,"url":null,"abstract":"Challenges in scaling of semiconductor memory technologies are reviewed with the focus on DRAM and NAND Flash while demands for memory improvement in the ICT industry are increasing. This paper introduces evolutionary and revolutionary paths to overcome scaling challenges of current and emerging memory technologies along with some promising solutions.","PeriodicalId":186544,"journal":{"name":"2016 IEEE International Electron Devices Meeting (IEDM)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"90","resultStr":"{\"title\":\"Technology scaling challenges and opportunities of memory devices\",\"authors\":\"Seok-Hee Lee\",\"doi\":\"10.1109/IEDM.2016.7838026\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Challenges in scaling of semiconductor memory technologies are reviewed with the focus on DRAM and NAND Flash while demands for memory improvement in the ICT industry are increasing. This paper introduces evolutionary and revolutionary paths to overcome scaling challenges of current and emerging memory technologies along with some promising solutions.\",\"PeriodicalId\":186544,\"journal\":{\"name\":\"2016 IEEE International Electron Devices Meeting (IEDM)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"90\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Electron Devices Meeting (IEDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2016.7838026\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2016.7838026","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Technology scaling challenges and opportunities of memory devices
Challenges in scaling of semiconductor memory technologies are reviewed with the focus on DRAM and NAND Flash while demands for memory improvement in the ICT industry are increasing. This paper introduces evolutionary and revolutionary paths to overcome scaling challenges of current and emerging memory technologies along with some promising solutions.