用移相点衍射干涉仪测试高精度光学器件

N. Voznesenskiy, Mariia Voznesenskaia, D. Jha
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引用次数: 1

摘要

先进的计算技术使高精度光学器件的制造成为可能。验证它们的测量技术主要基于菲索干涉测量法,由于参考平面等外部附件,其精度受到限制。缺乏适当的验证方法对精密光学元件的制造和优化产生了不利的影响。在本文中,我们探索了一种完全不同的干涉测量安排,由Difrotec生产的D7。利用相移点衍射干涉仪(PSPDI)对凹球进行了精度为λ/1000 PV的测量,并将其与子孔径拼接(SAS)获得的波前图进行了比较,验证了拼接精度。本文还介绍了利用SAS对非球面腔体的测量,其测量精度为λ/500 RMS,讨论了以纳米精度测量凹/凸球和r数≥0.5的非球面的策略,并对PSPDI D7的未来应用前景进行了展望。
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Testing high accuracy optics using the phase shifting point diffraction interferometer
Advanced figuring technology has enabled manufacturing of high accuracy optics for precision applications. The measurement technologies to verify them are largely based on Fizeau interferometry, which is limited in terms of accuracy because of external accessories such as reference flat. Lack of appropriate verification method is adversely affecting the manufacturing and optimization of precision optics. In this paper, we explore a fundamentally different interferometry arrangement, D7 produced by Difrotec. A phase shifting point diffraction interferometer (PSPDI) and present measurement results for concave spheres with an accuracy of λ/1000 PV, and compared this full-shot result with wavefront maps obtained by subaperture stitching (SAS) to verify stitching accuracy. We also describe measurement of asphere cavity using SAS, with higher accuracy, λ/500 RMS, discuss strategies to measure concave/convex spheres and aspheres with R-number ≥ 0.5 with nanometer accuracy, and conclude with perspectives on the future applications of PSPDI D7.
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