基于砷化镓纳米结构的亚毫米二极管

N. Goncharuk, N. Karushkin, V. Malyshko, V. A. Orehovskiy
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引用次数: 0

摘要

目前的技术允许制造层宽度低至纳米的GaAs/AlGaAs异质结构。电子隧穿宽度和高度仅为十分之一电子伏的AlGaAs势垒的时间小于1皮秒。这使得在单势垒纳米结构的基础上,通过AlGaAs势垒注入电子隧道和在GaAs过渡层中漂移电子成为可能,并且电子隧道和过渡的时间延迟相当。我们在小信号理论的框架下研究了二极管的微波阻抗,但考虑了谐振隧道二极管的电子注入延迟和传输延迟。
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Submillimeter diode on gallium arsenide nanostructure
Present-day technology allows manufacturing of GaAs/AlGaAs heterostructures with layers width down to a nanometer. Time of electron tunneling through AlGaAs potential barrier with such width and height of a few tenths of electron volt is less than a picosecond. It makes possible to create microwave diode on base of the single-barrier nanostructure with electron tunnel injection through AlGaAs potential barrier and electron drift in GaAs transit layer with comparable time delays of electron tunneling and transit. Microwave impedance of the diode we study in framework of small-signal theory but with considering electron injection delay along with transit delay as for resonant-tunneling diode.
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