{"title":"基于sram的物理不可克隆函数(puf)生成硅外签名用于认证和加密","authors":"K. Nii","doi":"10.1007/978-4-431-56594-9_29","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"15 5","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SRAM-Based Physical Unclonable Functions (PUFs) to Generate Signature Out of Silicon for Authentication and Encryption\",\"authors\":\"K. Nii\",\"doi\":\"10.1007/978-4-431-56594-9_29\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":127041,\"journal\":{\"name\":\"VLSI Design and Test for Systems Dependability\",\"volume\":\"15 5\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"VLSI Design and Test for Systems Dependability\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-4-431-56594-9_29\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"VLSI Design and Test for Systems Dependability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-4-431-56594-9_29","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}