Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_21
T. Kuroda, Atsutake Kosuge
{"title":"Wireless Interconnect in Electronic Systems","authors":"T. Kuroda, Atsutake Kosuge","doi":"10.1007/978-4-431-56594-9_21","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_21","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123587707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_12
N. Kanekawa, T. Miyoshi, M. Fujita, Takeshi Matsumoto, Hiroaki Yoshida, Satoshi Jo, S. Kajihara, S. Ohtake, Masashi Imai, T. Yoneda, H. Takizawa, Ye Gao, Masayuki Sato, Ryusuke Egawa, Hiroaki Kobayashi
{"title":"Unknown Threats and Provisions","authors":"N. Kanekawa, T. Miyoshi, M. Fujita, Takeshi Matsumoto, Hiroaki Yoshida, Satoshi Jo, S. Kajihara, S. Ohtake, Masashi Imai, T. Yoneda, H. Takizawa, Ye Gao, Masayuki Sato, Ryusuke Egawa, Hiroaki Kobayashi","doi":"10.1007/978-4-431-56594-9_12","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_12","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"316 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116366369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_7
K. Tsubouchi, F. Adachi, S. Kameda, M. Motoyoshi, A. Taira, N. Suematsu, T. Takagi, H. Oguma, M. Fujishima, R. Inagaki, M. Tsuru, E. Taniguchi, H. Fukumoto, A. Matsuzawa, M. Miyahara, M. Iwata, F. Yamagata, N. Izuka
{"title":"Connectivity in Wireless Telecommunications","authors":"K. Tsubouchi, F. Adachi, S. Kameda, M. Motoyoshi, A. Taira, N. Suematsu, T. Takagi, H. Oguma, M. Fujishima, R. Inagaki, M. Tsuru, E. Taniguchi, H. Fukumoto, A. Matsuzawa, M. Miyahara, M. Iwata, F. Yamagata, N. Izuka","doi":"10.1007/978-4-431-56594-9_7","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_7","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125704669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_9
T. Yoneda, Y. Nakabo, N. Yamasaki, Masayoshi Takasu, Masashi Imai, S. Kameda, H. Oguma, A. Taira, N. Suematsu, T. Takagi, K. Tsubouchi
{"title":"Responsiveness and Timing","authors":"T. Yoneda, Y. Nakabo, N. Yamasaki, Masayoshi Takasu, Masashi Imai, S. Kameda, H. Oguma, A. Taira, N. Suematsu, T. Takagi, K. Tsubouchi","doi":"10.1007/978-4-431-56594-9_9","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_9","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"7 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123730177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_29
K. Nii
{"title":"SRAM-Based Physical Unclonable Functions (PUFs) to Generate Signature Out of Silicon for Authentication and Encryption","authors":"K. Nii","doi":"10.1007/978-4-431-56594-9_29","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_29","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"15 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120871120","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_16
K. Hatayama, S. Kajihara, T. Yoneda, Yuta Yamato, M. Inoue, Yasuo Sato, Y. Miura, S. Ohtake
{"title":"DART—A Concept of In-field Testing for Enhancing System Dependability","authors":"K. Hatayama, S. Kajihara, T. Yoneda, Yuta Yamato, M. Inoue, Yasuo Sato, Y. Miura, S. Ohtake","doi":"10.1007/978-4-431-56594-9_16","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_16","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"198 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114201809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_27
H. Hihara, A. Iwasaki, M. Hashimoto, H. Ochi, Y. Mitsuyama, H. Onodera, H. Kanbara, K. Wakabayashi, T. Sugibayashi, Takashi Takenaka, H. Hada, M. Tada
{"title":"Applications of Reconfigurable Processors as Embedded Automatons in the IoT Sensor Networks in Space","authors":"H. Hihara, A. Iwasaki, M. Hashimoto, H. Ochi, Y. Mitsuyama, H. Onodera, H. Kanbara, K. Wakabayashi, T. Sugibayashi, Takashi Takenaka, H. Hada, M. Tada","doi":"10.1007/978-4-431-56594-9_27","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_27","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114382933","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_2
S. Asai
{"title":"Design and Development of Electronic Systems for Quality and Dependability","authors":"S. Asai","doi":"10.1007/978-4-431-56594-9_2","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_2","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132770038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_19
T. Yoneda, Masashi Imai, H. Saito, A. Mochizuki, T. Hanyu, Kenji Kise, Yuichi Nakamura
{"title":"Network-on-Chip Based Multiple-Core Centralized ECUs for Safety-Critical Automotive Applications","authors":"T. Yoneda, Masashi Imai, H. Saito, A. Mochizuki, T. Hanyu, Kenji Kise, Yuichi Nakamura","doi":"10.1007/978-4-431-56594-9_19","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_19","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123645673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-07-21DOI: 10.1007/978-4-431-56594-9_15
S. Oho, Yasuhiro Ito, Y. Sugure, Y. Nakata, H. Kawaguchi, M. Yoshimoto
{"title":"Virtualization: System-Level Fault Simulation of SRAM Errors in Automotive Electronic Control Systems","authors":"S. Oho, Yasuhiro Ito, Y. Sugure, Y. Nakata, H. Kawaguchi, M. Yoshimoto","doi":"10.1007/978-4-431-56594-9_15","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_15","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123735556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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