{"title":"基于IC属性、家族IC老化数据和失效机制分析的新老化方法","authors":"Sut-Mui Tang","doi":"10.1109/RAMS.1996.500661","DOIUrl":null,"url":null,"abstract":"This paper describes a new methodology for selecting effective burn-in strategies for integrated circuits (ICs) in automotive applications. The method analyzes failure mechanisms for different IC technologies and utilizes family IC data to determine appropriate burn-in conditions for new ICs. The burn-in effectiveness for metal-oxide-semiconductor (MOS) and bipolar technologies is discussed. Burn-in data is presented to demonstrate that burn-in is no longer a cost effective screening process for bipolar ICs and some MOS ICs, but it is still needed for MOS ICs with large die sizes and complex processing technologies. Data also reveals that burn-in is primarily useful for detecting wafer processing defects rather than packaging defects. To select family ICs, a method based on IC attributes is described. Practical guidelines on how to use family IC data and acceleration factors to reduce burn-in time are also explained.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"New burn-in methodology based on IC attributes, family IC burn-in data, and failure mechanism analysis\",\"authors\":\"Sut-Mui Tang\",\"doi\":\"10.1109/RAMS.1996.500661\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a new methodology for selecting effective burn-in strategies for integrated circuits (ICs) in automotive applications. The method analyzes failure mechanisms for different IC technologies and utilizes family IC data to determine appropriate burn-in conditions for new ICs. The burn-in effectiveness for metal-oxide-semiconductor (MOS) and bipolar technologies is discussed. Burn-in data is presented to demonstrate that burn-in is no longer a cost effective screening process for bipolar ICs and some MOS ICs, but it is still needed for MOS ICs with large die sizes and complex processing technologies. Data also reveals that burn-in is primarily useful for detecting wafer processing defects rather than packaging defects. To select family ICs, a method based on IC attributes is described. Practical guidelines on how to use family IC data and acceleration factors to reduce burn-in time are also explained.\",\"PeriodicalId\":393833,\"journal\":{\"name\":\"Proceedings of 1996 Annual Reliability and Maintainability Symposium\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-01-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1996 Annual Reliability and Maintainability Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS.1996.500661\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.1996.500661","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New burn-in methodology based on IC attributes, family IC burn-in data, and failure mechanism analysis
This paper describes a new methodology for selecting effective burn-in strategies for integrated circuits (ICs) in automotive applications. The method analyzes failure mechanisms for different IC technologies and utilizes family IC data to determine appropriate burn-in conditions for new ICs. The burn-in effectiveness for metal-oxide-semiconductor (MOS) and bipolar technologies is discussed. Burn-in data is presented to demonstrate that burn-in is no longer a cost effective screening process for bipolar ICs and some MOS ICs, but it is still needed for MOS ICs with large die sizes and complex processing technologies. Data also reveals that burn-in is primarily useful for detecting wafer processing defects rather than packaging defects. To select family ICs, a method based on IC attributes is described. Practical guidelines on how to use family IC data and acceleration factors to reduce burn-in time are also explained.