光学干涉仪技术在精确测量材料温度、生长和折射率变化中的应用综述

B. R. Reddy
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引用次数: 0

摘要

综述了各种干涉仪技术及其应用。详细介绍了光学外差检测的原理及其在原位测量晶体生长速率、涂层反射镜表面粗糙度和激光加热温度变化等方面的应用。详细介绍了荧光比法、荧光寿命测量、迈克尔逊干涉仪和马赫-曾德干涉仪技术在温度变化测量中的应用。介绍了利用马赫-曾德尔干涉仪监测溶液折射率或浓度变化的方法。对其中一些测量结果进行了详细的误差分析。
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Applications of Optical Interferometer Techniques for Precision Measurements of Changes in Temperature, Growth and Refractive Index of Materials: A Brief Review
Different interferometer techniques and their applications are surveyed. The principle of optical heterodyne detection and its applications to in situ measurement of crystal growth rate, surface roughness measurement of coated mirrors and temperature changes due to laser heating are described in detail. Application of fluorescence ratio method, fluorescence lifetime measurement, Michelson interferometer and Mach-Zehnder interferometer techniques, for the measurement of temperature changes, are described in detail. The use of Mach-Zehnder interferometer to monitor changes in solution refractive index or concentration is described. A detailed error analysis is given for some of the measurements.
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