毫米波波段纳米级MOS器件本征部分高频效应分析

J. Hasani, Mahmoud Kamarei, Fabien Ndagijimana
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引用次数: 4

摘要

在毫米波CMOS集成设计中,有源器件可能出现分布效应。本文分析了本征MOS晶体管中的分布效应。本文对非准静态效应进行了综述,并通过对意法半导体90nm CMOS技术代工设计套件的仿真,证明了非准静态效应在毫米波波段的重要性。考虑到MOS晶体管的分布特性,对其分布效应进行了分析和建模,导出了计算晶体管Y参数的封闭形式方程。分析结果与仿真结果吻合良好。结果表明,采用门指双连接策略可以避免毫米波波段的分布效应。
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Analysis of high frequency effects in the intrinsic part of nano-metre scale MOS devices in millimeter wave band
Distributed effects may appear in active devices in mm-wave CMOS integrated design. In this paper we have analyzed the distributed effects in the intrinsic MOS transistor. Non-quasi static effect has been reviewed and its importance in mm-wave band has been demonstrated by simulations in the foundry design kit for STMicroelectronics 90nm CMOS technology. The distributed effect of MOS transistor has been analyzed and modeled and closed form equations have been derived to calculate Y parameters of the transistor, considering the distributed nature of the transistor. Analysis results are in excellent agreement with the simulation results. The results show that by using the strategy of double connection to the gate finger the distributed effects can be avoided in millimeter wave band.
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