B. Moon, D. Jung, J. Chung, C. Joung, J. Hong, S. Lee, Y. Shin, C. Yoo
{"title":"全数字多通道CMOS电容式传感器","authors":"B. Moon, D. Jung, J. Chung, C. Joung, J. Hong, S. Lee, Y. Shin, C. Yoo","doi":"10.1109/ASSCC.2006.357897","DOIUrl":null,"url":null,"abstract":"A full-digital 12-channel, 100-step capacitive sensor is described. The capacitance to be sensed forms an RC-delay line whose delay is compared with that of a reference RC-delay line. The difference of the RC delays is sensed by a simple full-digital time-to-digital converter (TDC). By compensating the parasitic capacitance at power up, the capacitive sensor implemented in a 0.35 mum standard digital CMOS technology shows 30fF sensing resolution. The capacitive sensor consumes 5 muA per channel under 3.3V supply voltage.","PeriodicalId":142478,"journal":{"name":"2006 IEEE Asian Solid-State Circuits Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A Full-Digital Multi-Channel CMOS Capacitive Sensor\",\"authors\":\"B. Moon, D. Jung, J. Chung, C. Joung, J. Hong, S. Lee, Y. Shin, C. Yoo\",\"doi\":\"10.1109/ASSCC.2006.357897\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A full-digital 12-channel, 100-step capacitive sensor is described. The capacitance to be sensed forms an RC-delay line whose delay is compared with that of a reference RC-delay line. The difference of the RC delays is sensed by a simple full-digital time-to-digital converter (TDC). By compensating the parasitic capacitance at power up, the capacitive sensor implemented in a 0.35 mum standard digital CMOS technology shows 30fF sensing resolution. The capacitive sensor consumes 5 muA per channel under 3.3V supply voltage.\",\"PeriodicalId\":142478,\"journal\":{\"name\":\"2006 IEEE Asian Solid-State Circuits Conference\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 IEEE Asian Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASSCC.2006.357897\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2006.357897","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Full-Digital Multi-Channel CMOS Capacitive Sensor
A full-digital 12-channel, 100-step capacitive sensor is described. The capacitance to be sensed forms an RC-delay line whose delay is compared with that of a reference RC-delay line. The difference of the RC delays is sensed by a simple full-digital time-to-digital converter (TDC). By compensating the parasitic capacitance at power up, the capacitive sensor implemented in a 0.35 mum standard digital CMOS technology shows 30fF sensing resolution. The capacitive sensor consumes 5 muA per channel under 3.3V supply voltage.