{"title":"基于智能计算机的培训","authors":"M. Ben-Bassat, I. Beniaminy, D. Joseph","doi":"10.1109/AUTEST.1997.633568","DOIUrl":null,"url":null,"abstract":"Increasingly complex test equipment, complex technologies, growing pressure on technicians' and engineers' performance, and the need for integrated knowledge during the problem-resolution process, are all demanding a higher level of expertise and a new approach to training.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Intelligent computer based training\",\"authors\":\"M. Ben-Bassat, I. Beniaminy, D. Joseph\",\"doi\":\"10.1109/AUTEST.1997.633568\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Increasingly complex test equipment, complex technologies, growing pressure on technicians' and engineers' performance, and the need for integrated knowledge during the problem-resolution process, are all demanding a higher level of expertise and a new approach to training.\",\"PeriodicalId\":369132,\"journal\":{\"name\":\"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1997.633568\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1997.633568","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Increasingly complex test equipment, complex technologies, growing pressure on technicians' and engineers' performance, and the need for integrated knowledge during the problem-resolution process, are all demanding a higher level of expertise and a new approach to training.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
