Deeptimayee Dash, R. Gautam, Rohan Chauhan, Raghav C Dwivedi, Pushpendra Singh
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In this paper, A Bragg Reflector with a defect layer in the middle is designed and analysed. Reflectance of the structure is evaluated by Transfer Matrix Method (TMM). The bandgap of the Bragg reflector is found to benear IR region (760 nm – 940 nm) with bandgap width of ∆λ = 180 nm. By increasing the width of defect layer resonating wavelength get shifted to new wavelength. Graph is plotted between the defect layer and the resonating wavelength. The simulation is performed by means of the software tool COMSOL. By comparing the measured results with the reported evidence, the accuracy of the measurement is checked.
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