A. Morini, M. Farina, M. Guglielmi, P. M. Iglesias, P. Angeletti
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Generalized Thru-Reflect-Line Calibration for the Measurement of Waveguide Devices up to the third Harmonic: First Results
The Generalized Reflect Thru Line (GTRL) calibration technique is used for the measurement of a waveguide devices operating in a multioctave band region. In this contribution some preliminary results are shown concerning measurements done up to the third harmonic, where up to four modes are above cutoff.