SMD封装和基板翘曲对质量和可靠性的影响——测量、影响和对策

H. Wohlrabe, K. Meier, Oliver Albrecht
{"title":"SMD封装和基板翘曲对质量和可靠性的影响——测量、影响和对策","authors":"H. Wohlrabe, K. Meier, Oliver Albrecht","doi":"10.1109/ESTC.2018.8546438","DOIUrl":null,"url":null,"abstract":"The coplanarity difference between a substrate or printed circuit board and a SMD package is a very important characteristic. It depends on the warpage of package and substrate and is caused by their heterogeneous build up. The materials involved – namely polymers, metals, ceramics etc. – come with differing coefficients of thermal expansion. This leads to temperature depending deformations due to thermal loads during assembly or field use. These warpage called deformations appear as twist and bow. A significant coplanarity or warpage mismatch can lead to quality issues during manufacturing. Solder joint shorts, pad cratering and open solder joints like head-inpillow or pin-in-pillow are examples of typical failure types. Also, additional mechanical stress especially in z-direction may occur in the solder joints and cause early failure under use.","PeriodicalId":198238,"journal":{"name":"2018 7th Electronic System-Integration Technology Conference (ESTC)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Influences of SMD Package and Substrate Warpage on Quality and Reliability –Measurement, Effects and Counteractions\",\"authors\":\"H. Wohlrabe, K. Meier, Oliver Albrecht\",\"doi\":\"10.1109/ESTC.2018.8546438\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The coplanarity difference between a substrate or printed circuit board and a SMD package is a very important characteristic. It depends on the warpage of package and substrate and is caused by their heterogeneous build up. The materials involved – namely polymers, metals, ceramics etc. – come with differing coefficients of thermal expansion. This leads to temperature depending deformations due to thermal loads during assembly or field use. These warpage called deformations appear as twist and bow. A significant coplanarity or warpage mismatch can lead to quality issues during manufacturing. Solder joint shorts, pad cratering and open solder joints like head-inpillow or pin-in-pillow are examples of typical failure types. Also, additional mechanical stress especially in z-direction may occur in the solder joints and cause early failure under use.\",\"PeriodicalId\":198238,\"journal\":{\"name\":\"2018 7th Electronic System-Integration Technology Conference (ESTC)\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 7th Electronic System-Integration Technology Conference (ESTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESTC.2018.8546438\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 7th Electronic System-Integration Technology Conference (ESTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESTC.2018.8546438","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

基板或印刷电路板与SMD封装之间的共平面性差异是一个非常重要的特性。它取决于封装和衬底的翘曲,是由它们的异质堆积引起的。所涉及的材料-即聚合物,金属,陶瓷等-具有不同的热膨胀系数。这导致在装配或现场使用期间由于热负荷而产生的温度依赖变形。这些被称为变形的翘曲表现为扭曲和弯曲。明显的共面性或翘曲不匹配会导致制造过程中的质量问题。焊点短路,焊盘凹坑和开放焊点,如头枕或针枕是典型的失效类型的例子。此外,额外的机械应力,特别是在z方向上,可能会出现在焊点上,并在使用过程中导致早期失效。
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Influences of SMD Package and Substrate Warpage on Quality and Reliability –Measurement, Effects and Counteractions
The coplanarity difference between a substrate or printed circuit board and a SMD package is a very important characteristic. It depends on the warpage of package and substrate and is caused by their heterogeneous build up. The materials involved – namely polymers, metals, ceramics etc. – come with differing coefficients of thermal expansion. This leads to temperature depending deformations due to thermal loads during assembly or field use. These warpage called deformations appear as twist and bow. A significant coplanarity or warpage mismatch can lead to quality issues during manufacturing. Solder joint shorts, pad cratering and open solder joints like head-inpillow or pin-in-pillow are examples of typical failure types. Also, additional mechanical stress especially in z-direction may occur in the solder joints and cause early failure under use.
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