采用65纳米CMOS技术的远程低功耗无线局域网IEEE 802.11ah标准,采用包络跟踪供电偏置控制的高效f类ULP-PA设计与优化

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Circuits Devices & Systems Pub Date : 2022-07-18 DOI:10.1049/cds2.12125
Muhammad Ovais Akhter, Najam Muhammad Amin, Razia Zia
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引用次数: 1

摘要

本文介绍了一种基于65纳米互补金属氧化物半导体(CMOS)技术的sub-1 GHz f类超低功耗(ULP)功率放大器(PA)的设计与优化。采用包络跟踪(ET)电源偏置技术提高了fpa的效率。为了提高效率和节省足够的直流功耗,ET在检测器的正前方有一个前置放大器。PA由两个级联单元组成,端接为f类,具有门漏反馈,以增强线性度并限制输入信号的任何谐波成分。该设计的直流功耗为3.75 mW,功率增加效率为37.1%,工作在915 ~ 925 MHz无授权频段,总饱和输出功率为22 dBm,其中PA功率增益为14 dBm,符合IEEE 802.11ah远程低功耗无线局域网标准。用于ET电源偏置的无电感设计将芯片布局尺寸减小到仅0.13 mm2。
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Design and optimisation of high-efficient class-F ULP-PA using envelope tracking supply bias control for long-range low power wireless local area network IEEE 802.11ah standard using 65 nm CMOS technology

This article presents the design and optimisation of a sub-1 GHz class-F ultra-low power (ULP) power amplifier (PA) in 65 nm Complementary Metal Oxide Semiconductor (CMOS) technology. An envelope tracking (ET) supply biasing technique is adopted to improve the efficiency of class-F PA. The ET consist of a pre-amp right before the detector in order to enhance the efficiency and save adequate amount of dc power consumption. The PA consists of two cascode cells terminated as class-F with gate-to-drain feedback in order to enhance linearity and limit any harmonic component from the input signal. The novel design consumes a dc power of 3.75 mW, power added efficiency of 37.1%, operating at 915–925 MHz unlicensed band and total saturated output power of 22 dBm including 14 dBm power gain at PA, which qualifies under long-range low power wireless local area network IEEE 802.11ah standard. The inductor-less design for ET supply bias reduces the chip layout size to 0.13 mm2 only.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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