K. Otsubo, N. Sekine, Y. Nishijima, O. Aoki, A. Kuramata, H. Ishikawa
{"title":"低阈值电流密度(<80 a /cm/sup 2//well)的InGaAs三元衬底上1.3 /spl μ /m应变量子阱激光器","authors":"K. Otsubo, N. Sekine, Y. Nishijima, O. Aoki, A. Kuramata, H. Ishikawa","doi":"10.1109/ISLC.2000.882313","DOIUrl":null,"url":null,"abstract":"We have fabricated 1.3 /spl mu/m strained InGaAs-InAlGaAs quantum well lasers on InGaAs ternary substrates. A low J/N, of 74 A/cm/sup 2//well and high T/sub 0/ of 106 K were simultaneously obtained, in spite of poor surface morphology of the wafers. The T/sub 0/ increased when J/N was reduced, as we previously reported. The InGaAs substrates whose quality is the same as that of commercial InP and GaAs substrates should make 1.3 /spl mu/m lasers of much lower threshold and higher T/sub 0/ possible.","PeriodicalId":322366,"journal":{"name":"Conference Digest. 2000 IEEE 17th International Semiconductor Laser Conference. (Cat. No.00CH37092)","volume":"129 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"1.3 /spl mu/m strained quantum well lasers on InGaAs ternary substrates with a low threshold current density (<80 A/cm/sup 2//well)\",\"authors\":\"K. Otsubo, N. Sekine, Y. Nishijima, O. Aoki, A. Kuramata, H. Ishikawa\",\"doi\":\"10.1109/ISLC.2000.882313\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have fabricated 1.3 /spl mu/m strained InGaAs-InAlGaAs quantum well lasers on InGaAs ternary substrates. A low J/N, of 74 A/cm/sup 2//well and high T/sub 0/ of 106 K were simultaneously obtained, in spite of poor surface morphology of the wafers. The T/sub 0/ increased when J/N was reduced, as we previously reported. The InGaAs substrates whose quality is the same as that of commercial InP and GaAs substrates should make 1.3 /spl mu/m lasers of much lower threshold and higher T/sub 0/ possible.\",\"PeriodicalId\":322366,\"journal\":{\"name\":\"Conference Digest. 2000 IEEE 17th International Semiconductor Laser Conference. (Cat. No.00CH37092)\",\"volume\":\"129 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Digest. 2000 IEEE 17th International Semiconductor Laser Conference. (Cat. No.00CH37092)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISLC.2000.882313\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Digest. 2000 IEEE 17th International Semiconductor Laser Conference. (Cat. No.00CH37092)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISLC.2000.882313","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
1.3 /spl mu/m strained quantum well lasers on InGaAs ternary substrates with a low threshold current density (<80 A/cm/sup 2//well)
We have fabricated 1.3 /spl mu/m strained InGaAs-InAlGaAs quantum well lasers on InGaAs ternary substrates. A low J/N, of 74 A/cm/sup 2//well and high T/sub 0/ of 106 K were simultaneously obtained, in spite of poor surface morphology of the wafers. The T/sub 0/ increased when J/N was reduced, as we previously reported. The InGaAs substrates whose quality is the same as that of commercial InP and GaAs substrates should make 1.3 /spl mu/m lasers of much lower threshold and higher T/sub 0/ possible.