Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs

This paper shows a novel simulation method for bulk current injection (BCI) tests of I/O buffer circuits of mobile system memory. The simulation model consists of BCI probe, directional coupler, PCB, PKG, and IC. The proposed method is based on a behavioural I/O buffer model using a pulse generator as an input. A detailed simulation flow is introduced and validated through simulations performed on several injection probe loading conditions using a power decoupling capacitor and an on-chip decoupling capacitor.