{"title":"vsi感应电机驱动开路故障的检测与识别","authors":"Snehal Ghorpade, S. Jagtap","doi":"10.1109/ICACCCT.2014.7019452","DOIUrl":null,"url":null,"abstract":"The objective of this project of is to develop a fault detection technique for MOSFET's open circuit faults in voltage source inverter (VSI)-fed induction motor drives. This consist the analysis of the control signals and the line-to-line voltage levels during the switching time of MOSFET, under both healthy and faulty conditions which requires line-to-line voltage measurement, which provides information about switching states. The fault detection scheme is achieved by a simple hardware and it can be included in the existing inverter system. It not only detects the accurate single and multiple faults diagnosis but also minimizes the fault detection time.","PeriodicalId":239918,"journal":{"name":"2014 IEEE International Conference on Advanced Communications, Control and Computing Technologies","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Detection and identification of open circuit faults in VSI-fed induction motor drive\",\"authors\":\"Snehal Ghorpade, S. Jagtap\",\"doi\":\"10.1109/ICACCCT.2014.7019452\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The objective of this project of is to develop a fault detection technique for MOSFET's open circuit faults in voltage source inverter (VSI)-fed induction motor drives. This consist the analysis of the control signals and the line-to-line voltage levels during the switching time of MOSFET, under both healthy and faulty conditions which requires line-to-line voltage measurement, which provides information about switching states. The fault detection scheme is achieved by a simple hardware and it can be included in the existing inverter system. It not only detects the accurate single and multiple faults diagnosis but also minimizes the fault detection time.\",\"PeriodicalId\":239918,\"journal\":{\"name\":\"2014 IEEE International Conference on Advanced Communications, Control and Computing Technologies\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE International Conference on Advanced Communications, Control and Computing Technologies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICACCCT.2014.7019452\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Conference on Advanced Communications, Control and Computing Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICACCCT.2014.7019452","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Detection and identification of open circuit faults in VSI-fed induction motor drive
The objective of this project of is to develop a fault detection technique for MOSFET's open circuit faults in voltage source inverter (VSI)-fed induction motor drives. This consist the analysis of the control signals and the line-to-line voltage levels during the switching time of MOSFET, under both healthy and faulty conditions which requires line-to-line voltage measurement, which provides information about switching states. The fault detection scheme is achieved by a simple hardware and it can be included in the existing inverter system. It not only detects the accurate single and multiple faults diagnosis but also minimizes the fault detection time.