90nm CMOS晶型核心容错架构案例研究

M. Stanisavljevic, F. Gurkaynak, A. Schmid, Y. Leblebici, M. Gabrani
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引用次数: 1

摘要

本文给出了不同容错体系结构的案例研究。重点是硅的实现。设计并制作了一个128位AES加密核作为主拓扑结构,并在其上应用了容错架构。容错体系结构之一是一种新型的四层体系结构,它对永久性和随机故障具有很大的免疫力。强调了平均/阈值层的特点。测试结果表明,四层结构在可靠性方面优于三层模块化冗余。
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Case study of fault-tolerant architectures for 90nm CMOS crythographic cores
This paper presents a case study of different fault-tolerant architectures. The emphasis is on the silicon realization. A 128 bit AES cryptographic core has been designed and fabricated as a main topology on which the fault-tolerant architectures have been applied. One of the fault-tolerant architectures is a novel four-layer architecture exhibiting a large immunity to permanent as well as random failures. Characteristics of the averaging/ thresholding layer are emphasized. Measurement results show advantage of four-layer architecture over triple modular redundancy in terms of reliability.
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