开关故障对软配置WSI成品率的影响

1990 Proceedings. International Conference on Wafer Scale Integration Pub Date : 1990-01-23 DOI:10.1109/ICWSI.1990.63896

M. Blatt

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引用次数: 6

摘要

以一个流水线存储系统为例，对一个容错交换网络进行了评估。蒙特卡罗模拟直接从电路布局中预测每个电路片的良率。电路产率结合系统模型来预测晶圆产率。以前的工作描述了基于现场产量的系统模型。需要低延迟的系统模型也显示依赖于交换机产量。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Effects of switch failure on soft-configurable WSI yield

A fault tolerant switch network is evaluated, using a pipelined memory system as an example application. Monte Carlo simulation predicts the yield of each circuit piece directly from the layout. Circuit yields are combined with a system model to predict wafer yield. Previous work described system models based on site yield. System models requiring low latency are shown to also depend on switch yield.<>

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1990 Proceedings. International Conference on Wafer Scale Integration

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