一种监测空间电子设备中质子引起的扰动的仪器

G. Mackay, I. Thomson, I. Adams, R. Nickson, A. Ng, N. Sultan
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引用次数: 3

摘要

一种小型、低功率的仪器已经被开发出来,用于监测空间电子设备中质子引起的扰动。该仪器将作为轨道上航天器的监测器,其中单事件干扰(seu)和其他单事件影响(see)被认为对机载电子设备构成重大危害。设计并建立了与卫星机载计算机对接的飞行模型。该仪器的质子能量范围在20 MeV到500 MeV之间,没有能量依赖。2.4/spl倍//sup -11/ cm/sup 2//bit的质子SEU截面对质子的敏感性比目前的飞行电子元件高几个数量级。第一个仪器将在地球同步转移轨道上的STRV 1c卫星上飞行。
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An instrument for monitoring proton-induced upsets in space electronics
A small, low power instrument has been developed to monitor proton-induced upsets in space-borne electronics. This instrument will act as a monitor for spacecraft in orbits where single event upsets (SEUs) and other single event effects (SEEs) are considered a significant hazard to on-board electronics. A Flight Model has been designed and built which interfaces with the satellite on-board computer. The instrument has been characterized over the proton energy range 20 MeV to 500 MeV and has no energy dependence. The proton SEU cross section of 2.4/spl times//sup -11/ cm/sup 2//bit is orders of magnitude more sensitive to protons than current flight electronics components. The first instrument will be flown on the STRV 1c satellite in a Geosynchronous Transfer Orbit.
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