{"title":"美国海军2M/ATE计划:舰队自给自足、准备就绪和逐步维护","authors":"P. Rodgers","doi":"10.1109/AUTEST.1992.270084","DOIUrl":null,"url":null,"abstract":"The US Navy's 2M/ATE (miniature/microminiature/automatic test equipment) program is intended to provide the fleet with high reliability electronic module test, diagnostic, and miniature/microminiature (2M) repair capabilities. The author covers the program's current status and future directions and plans. The goal is to increase fleet self-sufficiency, readiness, and cost reduction. The 2M/ATE program's repair capabilities and automatic digital/analog testers provide for organizational (O) and intermediate (I) level fault isolation and repair of electronic assemblies. The 2M portion of the program strives to provide the repair capabilities and electronic documentation needed for electronic circuit card assemblies and equipment at the O and I levels. The 2M push is for progressive maintenance which yields self-sufficiency and, thereby, readiness.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"US Navy 2M/ATE program: fleet self-sufficiency, readiness and progressive maintenance\",\"authors\":\"P. Rodgers\",\"doi\":\"10.1109/AUTEST.1992.270084\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The US Navy's 2M/ATE (miniature/microminiature/automatic test equipment) program is intended to provide the fleet with high reliability electronic module test, diagnostic, and miniature/microminiature (2M) repair capabilities. The author covers the program's current status and future directions and plans. The goal is to increase fleet self-sufficiency, readiness, and cost reduction. The 2M/ATE program's repair capabilities and automatic digital/analog testers provide for organizational (O) and intermediate (I) level fault isolation and repair of electronic assemblies. The 2M portion of the program strives to provide the repair capabilities and electronic documentation needed for electronic circuit card assemblies and equipment at the O and I levels. The 2M push is for progressive maintenance which yields self-sufficiency and, thereby, readiness.<<ETX>>\",\"PeriodicalId\":273287,\"journal\":{\"name\":\"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-09-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1992.270084\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1992.270084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
US Navy 2M/ATE program: fleet self-sufficiency, readiness and progressive maintenance
The US Navy's 2M/ATE (miniature/microminiature/automatic test equipment) program is intended to provide the fleet with high reliability electronic module test, diagnostic, and miniature/microminiature (2M) repair capabilities. The author covers the program's current status and future directions and plans. The goal is to increase fleet self-sufficiency, readiness, and cost reduction. The 2M/ATE program's repair capabilities and automatic digital/analog testers provide for organizational (O) and intermediate (I) level fault isolation and repair of electronic assemblies. The 2M portion of the program strives to provide the repair capabilities and electronic documentation needed for electronic circuit card assemblies and equipment at the O and I levels. The 2M push is for progressive maintenance which yields self-sufficiency and, thereby, readiness.<>