{"title":"测试和诊断产品数据表示","authors":"S. Fortier, A. Wilmot","doi":"10.1109/AUTEST.1992.270135","DOIUrl":null,"url":null,"abstract":"The Product Data Exchange using the Standard for the Exchange of Product Model Data (PDES/STEP) Application Protocols for Electronics program will develop application protocols for communicating information between activities within the electronic life cycle. The program, abbreviated as PAP-E, will develop application protocols (APs) in accordance with the PDES/STEP development philosophy. Information modeling during the application protocol development process is an integral part of this philosophy. The project will include a demonstration of a selected portion of the developed APs representing test and integrated diagnostics information. A pilot AP development activity being conducted is described.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Test and diagnostics product data representation\",\"authors\":\"S. Fortier, A. Wilmot\",\"doi\":\"10.1109/AUTEST.1992.270135\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Product Data Exchange using the Standard for the Exchange of Product Model Data (PDES/STEP) Application Protocols for Electronics program will develop application protocols for communicating information between activities within the electronic life cycle. The program, abbreviated as PAP-E, will develop application protocols (APs) in accordance with the PDES/STEP development philosophy. Information modeling during the application protocol development process is an integral part of this philosophy. The project will include a demonstration of a selected portion of the developed APs representing test and integrated diagnostics information. A pilot AP development activity being conducted is described.<<ETX>>\",\"PeriodicalId\":273287,\"journal\":{\"name\":\"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-09-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1992.270135\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1992.270135","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Product Data Exchange using the Standard for the Exchange of Product Model Data (PDES/STEP) Application Protocols for Electronics program will develop application protocols for communicating information between activities within the electronic life cycle. The program, abbreviated as PAP-E, will develop application protocols (APs) in accordance with the PDES/STEP development philosophy. Information modeling during the application protocol development process is an integral part of this philosophy. The project will include a demonstration of a selected portion of the developed APs representing test and integrated diagnostics information. A pilot AP development activity being conducted is described.<>
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