{"title":"基于PC的传感器测量系统","authors":"J. Curtis","doi":"10.1109/SFICON.2002.1159838","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":294424,"journal":{"name":"2nd ISA/IEEE Sensors for Industry Conference,","volume":"118 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"PC based sensor measurement systems\",\"authors\":\"J. Curtis\",\"doi\":\"10.1109/SFICON.2002.1159838\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":294424,\"journal\":{\"name\":\"2nd ISA/IEEE Sensors for Industry Conference,\",\"volume\":\"118 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2nd ISA/IEEE Sensors for Industry Conference,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SFICON.2002.1159838\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2nd ISA/IEEE Sensors for Industry Conference,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SFICON.2002.1159838","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}