{"title":"噪声和增益参数去嵌入测量的自动化系统","authors":"V. A. Hirsch, M. Brunsman, T. Miers","doi":"10.1109/ARFTG.1987.323854","DOIUrl":null,"url":null,"abstract":"This paper describes an automated noise and gain parameter measurement system which operates to 26.5 GHz and incorporates test fixture de-embedding. A unique combination of hardware components, operating software and fundamentally proven measurement techniques have been integrated to form a test system capable of highly accurate and repeatable noise and gain measurements. De-embedded noise and gain parameters obtained using this system will be presented for an 0.3 micron gate GaAs FET.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An Automated System for De-Embedded Measurements of Noise and Gain Parameters\",\"authors\":\"V. A. Hirsch, M. Brunsman, T. Miers\",\"doi\":\"10.1109/ARFTG.1987.323854\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes an automated noise and gain parameter measurement system which operates to 26.5 GHz and incorporates test fixture de-embedding. A unique combination of hardware components, operating software and fundamentally proven measurement techniques have been integrated to form a test system capable of highly accurate and repeatable noise and gain measurements. De-embedded noise and gain parameters obtained using this system will be presented for an 0.3 micron gate GaAs FET.\",\"PeriodicalId\":287736,\"journal\":{\"name\":\"29th ARFTG Conference Digest\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1987-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"29th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1987.323854\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1987.323854","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Automated System for De-Embedded Measurements of Noise and Gain Parameters
This paper describes an automated noise and gain parameter measurement system which operates to 26.5 GHz and incorporates test fixture de-embedding. A unique combination of hardware components, operating software and fundamentally proven measurement techniques have been integrated to form a test system capable of highly accurate and repeatable noise and gain measurements. De-embedded noise and gain parameters obtained using this system will be presented for an 0.3 micron gate GaAs FET.
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