硅玻璃的吸收边

Proceedings of 2005 IEEE/LEOS Workshop on Fibres and Optical Passive Components, 2005. Pub Date : 2005-06-22 DOI:10.1109/WFOPC.2005.1462147

R. Boscaino, E. Vella, G. Navarra

{"title":"硅玻璃的吸收边","authors":"R. Boscaino, E. Vella, G. Navarra","doi":"10.1109/WFOPC.2005.1462147","DOIUrl":null,"url":null,"abstract":"Measurements of optical absorption in the v-UV range in a variety of silica glass are used to determine the width of the absorption edge (Urbach energy). Measured values range from 60 meV up to 180 meV. So high a variability over silica types is tentatively ascribed to the different disorder degree, which characterizes different materials.","PeriodicalId":445290,"journal":{"name":"Proceedings of 2005 IEEE/LEOS Workshop on Fibres and Optical Passive Components, 2005.","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2005-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":"{\"title\":\"Absorption edge in silica glass\",\"authors\":\"R. Boscaino, E. Vella, G. Navarra\",\"doi\":\"10.1109/WFOPC.2005.1462147\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Measurements of optical absorption in the v-UV range in a variety of silica glass are used to determine the width of the absorption edge (Urbach energy). Measured values range from 60 meV up to 180 meV. So high a variability over silica types is tentatively ascribed to the different disorder degree, which characterizes different materials.\",\"PeriodicalId\":445290,\"journal\":{\"name\":\"Proceedings of 2005 IEEE/LEOS Workshop on Fibres and Optical Passive Components, 2005.\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"18\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 2005 IEEE/LEOS Workshop on Fibres and Optical Passive Components, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WFOPC.2005.1462147\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 2005 IEEE/LEOS Workshop on Fibres and Optical Passive Components, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WFOPC.2005.1462147","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 18

摘要

测量各种硅玻璃在v-UV范围内的光吸收，以确定吸收边的宽度(乌尔巴赫能量)。测量值范围从60mev到180mev。因此，二氧化硅类型的高变异性暂定归因于不同材料的不同无序程度。

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Absorption edge in silica glass

Measurements of optical absorption in the v-UV range in a variety of silica glass are used to determine the width of the absorption edge (Urbach energy). Measured values range from 60 meV up to 180 meV. So high a variability over silica types is tentatively ascribed to the different disorder degree, which characterizes different materials.

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Proceedings of 2005 IEEE/LEOS Workshop on Fibres and Optical Passive Components, 2005.

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