{"title":"使用连续校验和的线性模拟电路中并发错误检测检查器的硬件减少","authors":"M.W.T. Wong, Yingquan Zhou, Y. Min","doi":"10.1109/TENCON.1995.496414","DOIUrl":null,"url":null,"abstract":"An algorithm proposed by Yingquan Zhou et al. (1995) for effectively reducing hardware overhead of the checking circuitry in the continuous checksums based concurrent error detection (CED) scheme in linear analog circuits is discussed. Without changing the original circuit, the algorithm generates such an appropriate coding matrix that makes the resulting checking circuitry have optimal hardware overhead.","PeriodicalId":425138,"journal":{"name":"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Hardware reduction in concurrent error detection checkers in linear analog circuits using continuous checksums\",\"authors\":\"M.W.T. Wong, Yingquan Zhou, Y. Min\",\"doi\":\"10.1109/TENCON.1995.496414\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An algorithm proposed by Yingquan Zhou et al. (1995) for effectively reducing hardware overhead of the checking circuitry in the continuous checksums based concurrent error detection (CED) scheme in linear analog circuits is discussed. Without changing the original circuit, the algorithm generates such an appropriate coding matrix that makes the resulting checking circuitry have optimal hardware overhead.\",\"PeriodicalId\":425138,\"journal\":{\"name\":\"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings\",\"volume\":\"95 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TENCON.1995.496414\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1995 IEEE TENCON. IEEE Region 10 International Conference on Microelectronics and VLSI. 'Asia-Pacific Microelectronics 2000'. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.1995.496414","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Hardware reduction in concurrent error detection checkers in linear analog circuits using continuous checksums
An algorithm proposed by Yingquan Zhou et al. (1995) for effectively reducing hardware overhead of the checking circuitry in the continuous checksums based concurrent error detection (CED) scheme in linear analog circuits is discussed. Without changing the original circuit, the algorithm generates such an appropriate coding matrix that makes the resulting checking circuitry have optimal hardware overhead.