Michael B. Steed, Steven B. Goldbergt, Glenn Rime, Paul D. Franzont, Iwona Turlikt, Jeff, Kastent
{"title":"介绍了通线脱嵌程序","authors":"Michael B. Steed, Steven B. Goldbergt, Glenn Rime, Paul D. Franzont, Iwona Turlikt, Jeff, Kastent","doi":"10.1109/MWSYM.1992.188284","DOIUrl":null,"url":null,"abstract":"The through-line (TL) method is introduced to replace the through-reflect-line (TRL) deembedding procedure. TL utilizes measurements of two lengths of line following approximate open-short-line calibration. TL accounts for the frequency-dependent characteristic impedance of the line and avoids the periodic glitches inherent in the TRL procedure.<<ETX>>","PeriodicalId":165665,"journal":{"name":"1992 IEEE Microwave Symposium Digest MTT-S","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"42","resultStr":"{\"title\":\"Introducing the through-line deembedding procedure\",\"authors\":\"Michael B. Steed, Steven B. Goldbergt, Glenn Rime, Paul D. Franzont, Iwona Turlikt, Jeff, Kastent\",\"doi\":\"10.1109/MWSYM.1992.188284\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The through-line (TL) method is introduced to replace the through-reflect-line (TRL) deembedding procedure. TL utilizes measurements of two lengths of line following approximate open-short-line calibration. TL accounts for the frequency-dependent characteristic impedance of the line and avoids the periodic glitches inherent in the TRL procedure.<<ETX>>\",\"PeriodicalId\":165665,\"journal\":{\"name\":\"1992 IEEE Microwave Symposium Digest MTT-S\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"42\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1992 IEEE Microwave Symposium Digest MTT-S\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1992.188284\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 IEEE Microwave Symposium Digest MTT-S","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1992.188284","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Introducing the through-line deembedding procedure
The through-line (TL) method is introduced to replace the through-reflect-line (TRL) deembedding procedure. TL utilizes measurements of two lengths of line following approximate open-short-line calibration. TL accounts for the frequency-dependent characteristic impedance of the line and avoids the periodic glitches inherent in the TRL procedure.<>