{"title":"VNU理学院5SDH-2颗粒加速器设备厚靶pixie分析评价","authors":"B. T. Hoa, N. T. Nghia, V. Phong, T. T. Anh","doi":"10.25073/2588-1124/vnumap.4623","DOIUrl":null,"url":null,"abstract":"This paper presents the evaluation of the Thick Target Particle Induced X-rays Emission (TTPIXE) technique using standard samples. The element-dependent standardization factor, H, as a function of X-ray energies is calibrated using standard sample NIST-611 and validated with two standard samples: IAEA-Soil7 and NIES-Pepperbush. The obtained results are in good agreement with the reference data. \n ","PeriodicalId":303178,"journal":{"name":"VNU Journal of Science: Mathematics - Physics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Evaluation of Thick Target PIXE Analysis in the 5SDH-2 Pelletron Accelerator Facility at VNU University of Science\",\"authors\":\"B. T. Hoa, N. T. Nghia, V. Phong, T. T. Anh\",\"doi\":\"10.25073/2588-1124/vnumap.4623\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the evaluation of the Thick Target Particle Induced X-rays Emission (TTPIXE) technique using standard samples. The element-dependent standardization factor, H, as a function of X-ray energies is calibrated using standard sample NIST-611 and validated with two standard samples: IAEA-Soil7 and NIES-Pepperbush. The obtained results are in good agreement with the reference data. \\n \",\"PeriodicalId\":303178,\"journal\":{\"name\":\"VNU Journal of Science: Mathematics - Physics\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"VNU Journal of Science: Mathematics - Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.25073/2588-1124/vnumap.4623\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"VNU Journal of Science: Mathematics - Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.25073/2588-1124/vnumap.4623","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evaluation of Thick Target PIXE Analysis in the 5SDH-2 Pelletron Accelerator Facility at VNU University of Science
This paper presents the evaluation of the Thick Target Particle Induced X-rays Emission (TTPIXE) technique using standard samples. The element-dependent standardization factor, H, as a function of X-ray energies is calibrated using standard sample NIST-611 and validated with two standard samples: IAEA-Soil7 and NIES-Pepperbush. The obtained results are in good agreement with the reference data.
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