{"title":"用串联的压电元件对物理传感器的输出电压倍增进行验证","authors":"K. Kanda, Taiki Ushita, T. Fujita, K. Maenaka","doi":"10.1109/MEMSYS.2018.8346735","DOIUrl":null,"url":null,"abstract":"For the first time, it is experimentally validated that the output voltage from series-connected piezoelectric elements on MEMS structure can be multiplied without degradation. The output voltage has been degraded for conventional devices (piezoelectric voltage-output sensors) based on the series-connected piezoelectric elements because of parasitic capacitances. The elimination of the parasitic capacitance by using not Si but polymer for structural material achieves output voltage multiplication.","PeriodicalId":400754,"journal":{"name":"2018 IEEE Micro Electro Mechanical Systems (MEMS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Validation of output voltage multiplication by using series-connected pizeoelectric elements for physical sensors\",\"authors\":\"K. Kanda, Taiki Ushita, T. Fujita, K. Maenaka\",\"doi\":\"10.1109/MEMSYS.2018.8346735\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For the first time, it is experimentally validated that the output voltage from series-connected piezoelectric elements on MEMS structure can be multiplied without degradation. The output voltage has been degraded for conventional devices (piezoelectric voltage-output sensors) based on the series-connected piezoelectric elements because of parasitic capacitances. The elimination of the parasitic capacitance by using not Si but polymer for structural material achieves output voltage multiplication.\",\"PeriodicalId\":400754,\"journal\":{\"name\":\"2018 IEEE Micro Electro Mechanical Systems (MEMS)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE Micro Electro Mechanical Systems (MEMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEMSYS.2018.8346735\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Micro Electro Mechanical Systems (MEMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSYS.2018.8346735","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Validation of output voltage multiplication by using series-connected pizeoelectric elements for physical sensors
For the first time, it is experimentally validated that the output voltage from series-connected piezoelectric elements on MEMS structure can be multiplied without degradation. The output voltage has been degraded for conventional devices (piezoelectric voltage-output sensors) based on the series-connected piezoelectric elements because of parasitic capacitances. The elimination of the parasitic capacitance by using not Si but polymer for structural material achieves output voltage multiplication.