E. Schmeichel, S. Hakimi, M. Otsuka, Geoff Sullivan
{"title":"减少故障识别的测试次数","authors":"E. Schmeichel, S. Hakimi, M. Otsuka, Geoff Sullivan","doi":"10.1109/FTCS.1988.5330","DOIUrl":null,"url":null,"abstract":"A bound is obtained for the number of rounds of testing sufficient to identify the faulty units of a system. Within a single round each unit may participate in at most one test. The authors give an adaptive algorithm which works in O(log/sub (n/t)//sup t/) rounds and uses O(n) tests. The multiplicative constants in the new bounds are small; four in both cases. This is a major improvement over previous nonadaptive and adaptive algorithm which required O(t+log n) rounds of testing and O(n+t) tests. If t>n/sup 1- epsilon /, then the algorithm runs within a constant number of rounds.<<ETX>>","PeriodicalId":171148,"journal":{"name":"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","volume":"104 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"On minimizing testing rounds for fault identification\",\"authors\":\"E. Schmeichel, S. Hakimi, M. Otsuka, Geoff Sullivan\",\"doi\":\"10.1109/FTCS.1988.5330\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A bound is obtained for the number of rounds of testing sufficient to identify the faulty units of a system. Within a single round each unit may participate in at most one test. The authors give an adaptive algorithm which works in O(log/sub (n/t)//sup t/) rounds and uses O(n) tests. The multiplicative constants in the new bounds are small; four in both cases. This is a major improvement over previous nonadaptive and adaptive algorithm which required O(t+log n) rounds of testing and O(n+t) tests. If t>n/sup 1- epsilon /, then the algorithm runs within a constant number of rounds.<<ETX>>\",\"PeriodicalId\":171148,\"journal\":{\"name\":\"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"volume\":\"104 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FTCS.1988.5330\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FTCS.1988.5330","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On minimizing testing rounds for fault identification
A bound is obtained for the number of rounds of testing sufficient to identify the faulty units of a system. Within a single round each unit may participate in at most one test. The authors give an adaptive algorithm which works in O(log/sub (n/t)//sup t/) rounds and uses O(n) tests. The multiplicative constants in the new bounds are small; four in both cases. This is a major improvement over previous nonadaptive and adaptive algorithm which required O(t+log n) rounds of testing and O(n+t) tests. If t>n/sup 1- epsilon /, then the algorithm runs within a constant number of rounds.<>