CDM应力非连接销的不良影响

2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Pub Date : 2018-09-01 DOI:10.23919/EOS/ESD.2018.8509750

T. Smedes, Greg O’Sullivan, R. Derikx, Artemio García, Bob Knoppers

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引用次数: 1

摘要

我们表明，非连接引脚的CDM测试可能导致随后连接引脚测试的应力过大或应力不足，从而可能导致不正确的鉴定。讨论了缓解方案。我们表明，在特殊情况下，CDM应力非连接销可能识别独特的失效模式。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Undesired Effects of CDM Stressing Non-Connected Pins

We show that CDM testing of non-connected pins can result in over-stress or under-stress on the subsequently connected pin tested, and thus can lead to incorrect qualification. Mitigation options are discussed. We show that in particular cases CDM stressing non-connected pins may identify unique fail modes.

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2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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