FRA: flash存储设备的flash感知冗余阵列

Yangsup Lee, Sanghyuk Jung, Y. Song
{"title":"FRA: flash存储设备的flash感知冗余阵列","authors":"Yangsup Lee, Sanghyuk Jung, Y. Song","doi":"10.1145/1629435.1629459","DOIUrl":null,"url":null,"abstract":"Since flash memory has many attractive characteristics such as high performance, non-volatility, low power consumption and shock resistance, it has been widely used as storage media in the embedded and computer system environments. In the case of reliability, however, there are many shortcomings in flash memory: potentially high I/O latency due to erase-before-write and poor durability due to limited erase cycles. To overcome these problems, a RAID technique borrowed from storage technology based on hard disks is employed. In the RAID technology, multi-bit burst failures in the page, block or device are easily detected and corrected so that the reliability can be significantly enhanced. However the existing RAID-5 scheme for the flash-based storage has delayed response time for parity updating. To overcome this problem, we propose a novel approach using a RAID technique in flash storage, called Flash-aware Redundancy Array. In this approach, parity updates are postponed so that they are not included in the critical path of read and write operations. Instead, they are scheduled for when the device becomes idle. For example, the proposed scheme shows a 19% improvement in the average write response time, compared to other approaches.","PeriodicalId":300268,"journal":{"name":"International Conference on Hardware/Software Codesign and System Synthesis","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2009-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"76","resultStr":"{\"title\":\"FRA: a flash-aware redundancy array of flash storage devices\",\"authors\":\"Yangsup Lee, Sanghyuk Jung, Y. Song\",\"doi\":\"10.1145/1629435.1629459\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Since flash memory has many attractive characteristics such as high performance, non-volatility, low power consumption and shock resistance, it has been widely used as storage media in the embedded and computer system environments. In the case of reliability, however, there are many shortcomings in flash memory: potentially high I/O latency due to erase-before-write and poor durability due to limited erase cycles. To overcome these problems, a RAID technique borrowed from storage technology based on hard disks is employed. In the RAID technology, multi-bit burst failures in the page, block or device are easily detected and corrected so that the reliability can be significantly enhanced. However the existing RAID-5 scheme for the flash-based storage has delayed response time for parity updating. To overcome this problem, we propose a novel approach using a RAID technique in flash storage, called Flash-aware Redundancy Array. In this approach, parity updates are postponed so that they are not included in the critical path of read and write operations. Instead, they are scheduled for when the device becomes idle. For example, the proposed scheme shows a 19% improvement in the average write response time, compared to other approaches.\",\"PeriodicalId\":300268,\"journal\":{\"name\":\"International Conference on Hardware/Software Codesign and System Synthesis\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-10-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"76\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Hardware/Software Codesign and System Synthesis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1629435.1629459\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Hardware/Software Codesign and System Synthesis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1629435.1629459","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 76

摘要

由于闪存具有高性能、无易失性、低功耗和抗冲击等优点,已广泛应用于嵌入式和计算机系统环境中作为存储介质。然而,就可靠性而言,闪存存在许多缺点:由于写前擦除,可能存在较高的I/O延迟;由于擦除周期有限,持久性较差。为了克服这些问题,采用了借鉴基于硬盘的存储技术的RAID技术。在RAID技术中,可以很容易地检测和纠正页面、块或设备中的多位突发故障,从而大大提高了可靠性。然而,现有的基于闪存的RAID-5方案延迟了奇偶更新的响应时间。为了克服这个问题,我们提出了一种使用闪存中的RAID技术的新方法,称为闪存感知冗余阵列。在这种方法中,奇偶校验更新被延迟,因此它们不包括在读写操作的关键路径中。相反,它们是在设备空闲时安排的。例如,与其他方法相比,所提出的方案在平均写响应时间上提高了19%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
FRA: a flash-aware redundancy array of flash storage devices
Since flash memory has many attractive characteristics such as high performance, non-volatility, low power consumption and shock resistance, it has been widely used as storage media in the embedded and computer system environments. In the case of reliability, however, there are many shortcomings in flash memory: potentially high I/O latency due to erase-before-write and poor durability due to limited erase cycles. To overcome these problems, a RAID technique borrowed from storage technology based on hard disks is employed. In the RAID technology, multi-bit burst failures in the page, block or device are easily detected and corrected so that the reliability can be significantly enhanced. However the existing RAID-5 scheme for the flash-based storage has delayed response time for parity updating. To overcome this problem, we propose a novel approach using a RAID technique in flash storage, called Flash-aware Redundancy Array. In this approach, parity updates are postponed so that they are not included in the critical path of read and write operations. Instead, they are scheduled for when the device becomes idle. For example, the proposed scheme shows a 19% improvement in the average write response time, compared to other approaches.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Furion: alleviating overheads for deep learning framework on single machine (work-in-progress) A chip-level security framework for assessing sensor data integrity: work-in-progress Dynamic data management for automotive ECUs with hybrid RAM-NVM memory: work-in-progress An on-chip interconnect and protocol stack for multiple communication paradigms and programming models Efficient dynamic voltage/frequency scaling through algorithmic loop transformation
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1