片上系统应用的CMOS器件优化

K. Imai, K. Yamaguchi, T. Kudo, N. Kimizuka, H. Onishi, A. Ono, Y. Nakahara, Y. Goto, K. Noda, S. Masuoka, S. Ito, K. Matsui, K. Ando, E. Hasegawa, T. Ohashi, N. Oda, K. Yokoyama, T. Takewaki, S. Sone, T. Horiuchi
{"title":"片上系统应用的CMOS器件优化","authors":"K. Imai, K. Yamaguchi, T. Kudo, N. Kimizuka, H. Onishi, A. Ono, Y. Nakahara, Y. Goto, K. Noda, S. Masuoka, S. Ito, K. Matsui, K. Ando, E. Hasegawa, T. Ohashi, N. Oda, K. Yokoyama, T. Takewaki, S. Sone, T. Horiuchi","doi":"10.1109/IEDM.2000.904354","DOIUrl":null,"url":null,"abstract":"This paper describes a 0.13-/spl mu/m-generation CMOS technology optimized for system-on-a-chip (SoC) applications. The wide-range of performances obtained using a triple gate oxide and multiple threshold voltage control allows the SoC to operate at high speed with low standby power. Core CMOS transistors, which have a 1.9 nm gate oxide and a 95-nm physical gate length, show an excellent drive current of 740/335 /spl mu/A//spl mu/m at 1.2 V. Low power CMOS transistors have a standby current of only 2-0.2 pA//spl mu/m with a 2.6-nm gate oxide and a 120-nm gate length. This technology has also been used to make a 1.4-/spl mu/m/sup 2/ loadless 4T SRAM cell as well as a 2.5-/spl mu/m/sup 2/ 6T cell. The wiring RC delay has been reduced by integrating Cu interconnects with a low-k \"ladder-oxide\" layer.","PeriodicalId":276800,"journal":{"name":"International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138)","volume":"153 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"CMOS device optimization for system-on-a-chip applications\",\"authors\":\"K. Imai, K. Yamaguchi, T. Kudo, N. Kimizuka, H. Onishi, A. Ono, Y. Nakahara, Y. Goto, K. Noda, S. Masuoka, S. Ito, K. Matsui, K. Ando, E. Hasegawa, T. Ohashi, N. Oda, K. Yokoyama, T. Takewaki, S. Sone, T. Horiuchi\",\"doi\":\"10.1109/IEDM.2000.904354\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a 0.13-/spl mu/m-generation CMOS technology optimized for system-on-a-chip (SoC) applications. The wide-range of performances obtained using a triple gate oxide and multiple threshold voltage control allows the SoC to operate at high speed with low standby power. Core CMOS transistors, which have a 1.9 nm gate oxide and a 95-nm physical gate length, show an excellent drive current of 740/335 /spl mu/A//spl mu/m at 1.2 V. Low power CMOS transistors have a standby current of only 2-0.2 pA//spl mu/m with a 2.6-nm gate oxide and a 120-nm gate length. This technology has also been used to make a 1.4-/spl mu/m/sup 2/ loadless 4T SRAM cell as well as a 2.5-/spl mu/m/sup 2/ 6T cell. The wiring RC delay has been reduced by integrating Cu interconnects with a low-k \\\"ladder-oxide\\\" layer.\",\"PeriodicalId\":276800,\"journal\":{\"name\":\"International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138)\",\"volume\":\"153 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2000.904354\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2000.904354","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17

摘要

本文介绍了针对片上系统(SoC)应用优化的0.13-/spl mu/m一代CMOS技术。使用三栅极氧化物和多个阈值电压控制获得的广泛性能允许SoC以低待机功率高速运行。具有1.9 nm栅极氧化物和95 nm物理栅极长度的核心CMOS晶体管在1.2 V时显示出740/335 /spl mu/ a //spl mu/m的优异驱动电流。低功耗CMOS晶体管待机电流仅为2-0.2 pA//spl mu/m,栅极氧化物为2.6 nm,栅极长度为120 nm。该技术还被用于制造1.4-/spl mu/m/sup 2/无负载4T SRAM单元以及2.5-/spl mu/m/sup 2/ 6T单元。通过将Cu互连与低k“阶梯氧化物”层集成,减少了布线RC延迟。
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CMOS device optimization for system-on-a-chip applications
This paper describes a 0.13-/spl mu/m-generation CMOS technology optimized for system-on-a-chip (SoC) applications. The wide-range of performances obtained using a triple gate oxide and multiple threshold voltage control allows the SoC to operate at high speed with low standby power. Core CMOS transistors, which have a 1.9 nm gate oxide and a 95-nm physical gate length, show an excellent drive current of 740/335 /spl mu/A//spl mu/m at 1.2 V. Low power CMOS transistors have a standby current of only 2-0.2 pA//spl mu/m with a 2.6-nm gate oxide and a 120-nm gate length. This technology has also been used to make a 1.4-/spl mu/m/sup 2/ loadless 4T SRAM cell as well as a 2.5-/spl mu/m/sup 2/ 6T cell. The wiring RC delay has been reduced by integrating Cu interconnects with a low-k "ladder-oxide" layer.
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