{"title":"在传统全桥变换器上优化场效应晶体管结构以提高其集成率的方法:影响失配引起的应力","authors":"E. Pankratov","doi":"10.33545/27076636.2023.v4.i1a.80","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":127185,"journal":{"name":"International Journal of Computing, Programming and Database Management","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On approach to optimize manufacturing of field-effect transistors framework a conventional full-bridge converter to increase their integration rate: On influence mismatch-induced stress\",\"authors\":\"E. Pankratov\",\"doi\":\"10.33545/27076636.2023.v4.i1a.80\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":127185,\"journal\":{\"name\":\"International Journal of Computing, Programming and Database Management\",\"volume\":\"60 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Computing, Programming and Database Management\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.33545/27076636.2023.v4.i1a.80\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Computing, Programming and Database Management","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.33545/27076636.2023.v4.i1a.80","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On approach to optimize manufacturing of field-effect transistors framework a conventional full-bridge converter to increase their integration rate: On influence mismatch-induced stress