{"title":"集成芯片暴露于电离辐射时的辐射效应","authors":"I. Zhuravleva","doi":"10.34220/mamsp_214-218","DOIUrl":null,"url":null,"abstract":"In the onboard equipment, components of electronics, which have increased sensitivity to the effects of ionizing radiation are widely used. The transient processes in electronic products are particularly dangerous, associated with an absorbed dose of radiation, leading to functional or irre-versible failures in the operation of onboard systems.","PeriodicalId":113054,"journal":{"name":"Materials of the All-Russian Scientific and Practical Conference \"Modern aspects of modeling systems and processes\"","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"RADIATION EFFECTS IN INTEGRATED CHIPS WHEN EXPOSED TO IONIZING RADIATION\",\"authors\":\"I. Zhuravleva\",\"doi\":\"10.34220/mamsp_214-218\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the onboard equipment, components of electronics, which have increased sensitivity to the effects of ionizing radiation are widely used. The transient processes in electronic products are particularly dangerous, associated with an absorbed dose of radiation, leading to functional or irre-versible failures in the operation of onboard systems.\",\"PeriodicalId\":113054,\"journal\":{\"name\":\"Materials of the All-Russian Scientific and Practical Conference \\\"Modern aspects of modeling systems and processes\\\"\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials of the All-Russian Scientific and Practical Conference \\\"Modern aspects of modeling systems and processes\\\"\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.34220/mamsp_214-218\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials of the All-Russian Scientific and Practical Conference \"Modern aspects of modeling systems and processes\"","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.34220/mamsp_214-218","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
RADIATION EFFECTS IN INTEGRATED CHIPS WHEN EXPOSED TO IONIZING RADIATION
In the onboard equipment, components of electronics, which have increased sensitivity to the effects of ionizing radiation are widely used. The transient processes in electronic products are particularly dangerous, associated with an absorbed dose of radiation, leading to functional or irre-versible failures in the operation of onboard systems.
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