提高EDA行业中客户感知的质量

G. Ben-Yaacov, Larry Bjork, Edward P. Stone
{"title":"提高EDA行业中客户感知的质量","authors":"G. Ben-Yaacov, Larry Bjork, Edward P. Stone","doi":"10.1109/ISQED.2000.838908","DOIUrl":null,"url":null,"abstract":"This paper describes the initial efforts of two quality groups, one representing EDA software suppliers, and the other representing their major customers, to understand and systematically improve EDA industry quality, as perceived by the customers. The groups continue to work toward this goal, and have reached agreement on several issues, including a defect classification system by severity, eight quality metrics, and a plan for reporting and publishing industry average quality trends using these metrics.","PeriodicalId":113766,"journal":{"name":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Advancing customer-perceived quality in the EDA industry\",\"authors\":\"G. Ben-Yaacov, Larry Bjork, Edward P. Stone\",\"doi\":\"10.1109/ISQED.2000.838908\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the initial efforts of two quality groups, one representing EDA software suppliers, and the other representing their major customers, to understand and systematically improve EDA industry quality, as perceived by the customers. The groups continue to work toward this goal, and have reached agreement on several issues, including a defect classification system by severity, eight quality metrics, and a plan for reporting and publishing industry average quality trends using these metrics.\",\"PeriodicalId\":113766,\"journal\":{\"name\":\"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-03-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2000.838908\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2000.838908","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

本文描述了两个质量小组的最初努力,一个代表EDA软件供应商,另一个代表他们的主要客户,以理解和系统地改进EDA行业质量,正如客户所感知的那样。这些小组继续朝着这个目标努力,并且在几个问题上达成了一致,包括根据严重程度划分的缺陷分类系统、8个质量度量标准,以及使用这些度量标准报告和发布行业平均质量趋势的计划。
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Advancing customer-perceived quality in the EDA industry
This paper describes the initial efforts of two quality groups, one representing EDA software suppliers, and the other representing their major customers, to understand and systematically improve EDA industry quality, as perceived by the customers. The groups continue to work toward this goal, and have reached agreement on several issues, including a defect classification system by severity, eight quality metrics, and a plan for reporting and publishing industry average quality trends using these metrics.
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