微带工艺介质介电常数的色散

2013 International Symposium on Electrodynamic and Mechatronic Systems (SELM) Pub Date : 2013-05-15 DOI:10.1109/SELM.2013.6562982

A. Girich, A. Moskaltsova, S. Nedukh

{"title":"微带工艺介质介电常数的色散","authors":"A. Girich, A. Moskaltsova, S. Nedukh","doi":"10.1109/SELM.2013.6562982","DOIUrl":null,"url":null,"abstract":"We propose a technique of determination of permittivity İ for undefined dielectric material as a substrate of microstrip line. The technique is in theoretical calculation of microstrip line spectrum and fitting the experimental results by varying the substrate permittivity.","PeriodicalId":244408,"journal":{"name":"2013 International Symposium on Electrodynamic and Mechatronic Systems (SELM)","volume":"150 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Dispersion of permittivity of technological dielectrics for microstrips\",\"authors\":\"A. Girich, A. Moskaltsova, S. Nedukh\",\"doi\":\"10.1109/SELM.2013.6562982\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a technique of determination of permittivity İ for undefined dielectric material as a substrate of microstrip line. The technique is in theoretical calculation of microstrip line spectrum and fitting the experimental results by varying the substrate permittivity.\",\"PeriodicalId\":244408,\"journal\":{\"name\":\"2013 International Symposium on Electrodynamic and Mechatronic Systems (SELM)\",\"volume\":\"150 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 International Symposium on Electrodynamic and Mechatronic Systems (SELM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SELM.2013.6562982\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 International Symposium on Electrodynamic and Mechatronic Systems (SELM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SELM.2013.6562982","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

我们提出了一种测定作为微带线衬底的未定义介电材料介电常数İ的技术。该技术是对微带线谱进行理论计算，并通过改变衬底介电常数来拟合实验结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Dispersion of permittivity of technological dielectrics for microstrips

We propose a technique of determination of permittivity İ for undefined dielectric material as a substrate of microstrip line. The technique is in theoretical calculation of microstrip line spectrum and fitting the experimental results by varying the substrate permittivity.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2013 International Symposium on Electrodynamic and Mechatronic Systems (SELM)

自引率

0.00%

发文量