Dongil Lee, Byung-Hyun Lee, J. Yoon, Bongsik Choi, Jun-Y. Park, Dae-Chul Ahn, C. Kim, Byeong-Woon Hwang, Seung‐Bae Jeon, Hyun Jun Ahn, Myeong-Lok Seol, Min-Ho Kang, B. Cho, Sung-Jin Choi, Yang‐Kyu Choi
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First demonstration of a wrap-gated CNT-FET with vertically-suspended channels
Fully wrap-gated carbon nanotube (CNT) transistors with vertically suspended (VS) semiconducting single-walled CNTs, purified up to 99.9%, are demonstrated for the first time. Without a sacrifice of scalability, remarkably enhanced gate controllability and charge transport capabilities were achieved due to the geometrical advantage of the gate-all-around (GAA) structure with multiple channels. The VS channels were formed with the aid of a silicon-processed vertically integrated nanowire frame, offering high completeness and compatibility with silicon processes. This approach will increase the applicability of CNTs toward high-performance emerging materials.