先进封装电源完整性和电磁干扰分析的有效方法

E. Liu, Xingchang Wei, Z. Oo, E. Li
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引用次数: 2

摘要

本文提出了一种二维全波方法,用于高速电子封装的高效功率完整性和电磁干扰分析。电子封装中的电源/地平面形成平行板结构,采用二维时域有限差分(2D FDTD)方法求解。导体损耗和衬底损耗均采用二维方法建模。除了平行板结构外,电子封装还包括许多传输线,包括微带和带状线结构。这两种结构也可以用二维方法进行解析。因此,在二维方法的背景下,可以建立一个统一的求解器,用于电子封装的信号和功率完整性分析。本文还讨论了电子封装的电磁干扰问题,主要集中在封装内平行板结构的边缘效应所产生的辐射。最后给出了数值算例。
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An efficient method for power integrity and EMI Analysis of advanced packages
A two-dimensional full-wave method is presented in this paper for efficient power integrity and EMI Analysis of highspeed electronic packages. The power/ground planes in electronic packages form a parallel-plate structure, which is solved by a 2D finite-different time domain (2D FDTD) method. Both the conductor loss and the substrate loss are modeled by the 2D method. Besides the parallel-plate structure, electronic packages also comprise of many transmission lines including microstrip- and stripline-type structures. Those two types of structures are also resolved by the 2D method. So a unified solver may be developed in the context of 2D method for the signal and power integrity analysis of electronic packages. The electromagnetic interference (EMI) issue of electronic packages is also touched in this paper, which is mainly focused on the radiation due to the edge effect of the parallel plate structure in a package. Numerical examples are given to demonstrate the method.
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