采用高达18 GHz的直接射频功率注入法研究集成电路的磁化率

Yin-Cheng Chang, S. Hsu, Yen-Tang Chang, Chiu-Kuo Chen, Hsu-Chen Cheng, D. Chang
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引用次数: 9

摘要

为了研究集成电路抗扰度,提出了18ghz的直接射频功率注入(DPI)测量方法。对DPI方法进行了综述,并讨论了扩展频率范围的考虑。此外,本文还描述了测量装置的细节。实现了功率注入路径中3db带宽为18.7 GHz的机载注入网络。低差稳压器(LDO)用于演示测试设置。所提出的DPI测试与实验结果表明了在18ghz以内的显著性。
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The direct RF power injection method up to 18 GHz for investigating IC's susceptibility
The direct RF power injection (DPI) measurement up to 18 GHz is proposed to investigate the IC immunity. The DPI method is reviewed and the consideration of extending frequency range is discussed. Furthermore, the details of the measurement setup are depicted in this work. The critical part, on-board injection network in the power injection path with a 3 dB bandwidth of 18.7 GHz is realized. A low dropout regulator (LDO) is used to demonstrate the test setup. The proposed DPI test with the experimental results shows the significance up to 18 GHz.
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