{"title":"用于低压高分辨率流水线ADC设计的多比特SC增益级热噪声分析","authors":"M. Azizi, A. Saeedfar, H. Hoseini, O. Shoaei","doi":"10.1109/SCS.2003.1227119","DOIUrl":null,"url":null,"abstract":"Analysis of thermal noise in switched-capacitor multi-bit gain-stages used in low-voltage high-resolution pipeline analog-to-digital converters is presented. The analytical expression obtained for the input referred noise power, which should be considered in the design procedure, is general for any number of bits being resolved and shows that the noise power is decreased when more bits are resolved in the stage.","PeriodicalId":375963,"journal":{"name":"Signals, Circuits and Systems, 2003. SCS 2003. International Symposium on","volume":"77 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Thermal noise analysis of multi-bit SC gain-stages for low-voltage high-resolution pipeline ADC design\",\"authors\":\"M. Azizi, A. Saeedfar, H. Hoseini, O. Shoaei\",\"doi\":\"10.1109/SCS.2003.1227119\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Analysis of thermal noise in switched-capacitor multi-bit gain-stages used in low-voltage high-resolution pipeline analog-to-digital converters is presented. The analytical expression obtained for the input referred noise power, which should be considered in the design procedure, is general for any number of bits being resolved and shows that the noise power is decreased when more bits are resolved in the stage.\",\"PeriodicalId\":375963,\"journal\":{\"name\":\"Signals, Circuits and Systems, 2003. SCS 2003. International Symposium on\",\"volume\":\"77 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Signals, Circuits and Systems, 2003. SCS 2003. International Symposium on\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SCS.2003.1227119\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Signals, Circuits and Systems, 2003. SCS 2003. International Symposium on","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SCS.2003.1227119","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Thermal noise analysis of multi-bit SC gain-stages for low-voltage high-resolution pipeline ADC design
Analysis of thermal noise in switched-capacitor multi-bit gain-stages used in low-voltage high-resolution pipeline analog-to-digital converters is presented. The analytical expression obtained for the input referred noise power, which should be considered in the design procedure, is general for any number of bits being resolved and shows that the noise power is decreased when more bits are resolved in the stage.
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