电磁干扰环境下单片系统时钟信号调制效率的测量

J. Semião, J. Freijedo, M. Moraes, M. Mallmann, C. Antunes, J. Benfica, F. Vargas, Marcelino B. Santos, I. Teixeira, J. Rodríguez-Andina, João Paulo Teixeira, D. Lupi, E. Gatti, L. Garcia, F. Hernandez
{"title":"电磁干扰环境下单片系统时钟信号调制效率的测量","authors":"J. Semião, J. Freijedo, M. Moraes, M. Mallmann, C. Antunes, J. Benfica, F. Vargas, Marcelino B. Santos, I. Teixeira, J. Rodríguez-Andina, João Paulo Teixeira, D. Lupi, E. Gatti, L. Garcia, F. Hernandez","doi":"10.1109/LATW.2009.4813817","DOIUrl":null,"url":null,"abstract":"As IC technology scales down, signal integrity issues such as power supply noise and clock skews are becoming one of the major concerns of gigahertz system-on-chip (SoC) design. Considering that one of the most important mechanisms to degrade signal integrity is electromagnetic interference (EMI), this paper analyzes the effectiveness of a clock duty-cycle (CDC) modulation technique to enhance SoC signal integrity with respect to power/ground voltage transients induced by EMI. The technique is based on a clock stretching logic (CSL) block, which monitors abnormal power grid activity and increases CDC accordingly. Practical experiments based on the implementation of a 32-bit soft-core pipeline processor in an FPGA IC were performed and illustrate the circuit robustness enhancement to power line fluctuations while maintaining at-speed clock rate. These experiments were conducted according to the IEC 62.132-2. Normative for measurement of radiated electromagnetic immunity (TEM-cell method).","PeriodicalId":343240,"journal":{"name":"2009 10th Latin American Test Workshop","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-03-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment\",\"authors\":\"J. Semião, J. Freijedo, M. Moraes, M. Mallmann, C. Antunes, J. Benfica, F. Vargas, Marcelino B. Santos, I. Teixeira, J. Rodríguez-Andina, João Paulo Teixeira, D. Lupi, E. Gatti, L. Garcia, F. Hernandez\",\"doi\":\"10.1109/LATW.2009.4813817\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As IC technology scales down, signal integrity issues such as power supply noise and clock skews are becoming one of the major concerns of gigahertz system-on-chip (SoC) design. Considering that one of the most important mechanisms to degrade signal integrity is electromagnetic interference (EMI), this paper analyzes the effectiveness of a clock duty-cycle (CDC) modulation technique to enhance SoC signal integrity with respect to power/ground voltage transients induced by EMI. The technique is based on a clock stretching logic (CSL) block, which monitors abnormal power grid activity and increases CDC accordingly. Practical experiments based on the implementation of a 32-bit soft-core pipeline processor in an FPGA IC were performed and illustrate the circuit robustness enhancement to power line fluctuations while maintaining at-speed clock rate. These experiments were conducted according to the IEC 62.132-2. Normative for measurement of radiated electromagnetic immunity (TEM-cell method).\",\"PeriodicalId\":343240,\"journal\":{\"name\":\"2009 10th Latin American Test Workshop\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-03-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 10th Latin American Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATW.2009.4813817\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 10th Latin American Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2009.4813817","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

随着集成电路技术的缩小,信号完整性问题,如电源噪声和时钟偏差,正成为千兆赫系统级芯片(SoC)设计的主要问题之一。考虑到降低信号完整性的最重要机制之一是电磁干扰(EMI),本文分析了时钟占空比(CDC)调制技术在电磁干扰引起的电源/地电压瞬变中提高SoC信号完整性的有效性。该技术基于时钟扩展逻辑(CSL)块,可监测电网异常活动并相应提高CDC。通过在FPGA上实现32位软核流水线处理器的实际实验,说明了在保持高速时钟速率的情况下,电路对电力线波动的鲁棒性增强。这些实验是根据IEC 62.132-2进行的。辐射电磁抗扰度测量规范(TEM-cell法)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment
As IC technology scales down, signal integrity issues such as power supply noise and clock skews are becoming one of the major concerns of gigahertz system-on-chip (SoC) design. Considering that one of the most important mechanisms to degrade signal integrity is electromagnetic interference (EMI), this paper analyzes the effectiveness of a clock duty-cycle (CDC) modulation technique to enhance SoC signal integrity with respect to power/ground voltage transients induced by EMI. The technique is based on a clock stretching logic (CSL) block, which monitors abnormal power grid activity and increases CDC accordingly. Practical experiments based on the implementation of a 32-bit soft-core pipeline processor in an FPGA IC were performed and illustrate the circuit robustness enhancement to power line fluctuations while maintaining at-speed clock rate. These experiments were conducted according to the IEC 62.132-2. Normative for measurement of radiated electromagnetic immunity (TEM-cell method).
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Test and qualification of a Fault Tolerant FPGA based Active Antenna System for space applications NoC interconnection functional testing: Using boundary-scan to reduce the overall testing time Fault tolerance assessment of PIC microcontroller based on fault injection Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors Study of radiation effects on PIN photodiodes with deep-trap levels using computer modeling
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1