利用光电子和反光电子能谱联合测定准单粒子带隙

Soohyung Park
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摘要

由于分析技术的进步,对许多以前看不见的物理现象的观察,特别是在纳米尺度的世界,已经成为最引人注目的研究领域。特别是,基于x射线和电子的尖端分析方法使原子级图像和结构的可视化成为可能。目前,这些方法不仅广泛应用于物理领域,而且广泛应用于电子、能源、生物医学和储氢等各种工程学科。韩国科学技术研究院(KIST)成立于1966年,是韩国第一家政府资助的综合研究机构,致力于国家关键领域的技术发展。KIST的先进分析和数据中心通过提供必要的分析和新的分析技术,在国家科学技术的进步中发挥了至关重要的作用。在本期特刊中,我们将讨论KIST提供的先进分析设备,涵盖从基本原理到应用和利用的整个分析技术领域。具体来说,我们将重点介绍物理研究中具有代表性的分析技术,如光电子能谱(PES)、x射线衍射(XRD)、透射电子显微镜(TEM)和基于机器学习的分析方法。
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Determination of Quasi-single Particle Bandgap by Using the Combination of Photoelectron and Inverse-photoelectron Spectroscopy
The observation of many previously unseen physical phenomena, especially in the nano-size world, has been the most dramatically advanced field of study due to the advancement of analytical technology. In particular, cutting-edge analytical methods based on X-rays and electrons have enabled the visualization of atomic-level images and structures. Currently, these methods are widely utilized not only in the field of physics but also in various engineering disciplines, such as electronics, energy, bio-medicine and hydrogen storage. Korea Institute of Science and Technology (KIST), established in 1966, is the first government-funded general research institute in South Korea that contributes to the technological development in key national sectors. Advanced analysis and data center at KIST have played a crucial role in the advancement of national science and technology by providing essential analysis and new analytical technologies. In this special issue, we will discuss advanced analytical equipment available at KIST covering the entire spectrum of analytical technology from fundamental principles to applications and utilization. Specifically, we will focus on the representative analytical technique for physics research, such as photoelectron spectroscopy (PES), X-ray diffraction (XRD), transmission electron microscopy (TEM), and machine learning-based analytical methods for their interpretation.
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