{"title":"加速热循环参数和几何尺寸对焊点可靠性的影响","authors":"Bingting Hu, Jie-min Zhou, P. Zhou, Yingge Yang","doi":"10.1109/HDP.2006.1707600","DOIUrl":null,"url":null,"abstract":"A simplified BGA flip chip model was established based on Ansys software to investigate thermal stress in the solder joints. The thermal cycle dwell time, thermal cycle temperature range and the maximum dwell temperature were changed to observe their effects on the thermal fatigue life of solder joint; the length and thickness of substrate were also changed to research the dimension effect. The thermal cycle lives were calculated and compared according to two different modified Coffin-Manson equations. The results indicate that the thermal fatigue life decreases with enlarging the thermal cycle dwell time, the thermal cycle range and the maximum dwell temperature. The fatigue life also decreases as the length and thickness of substrate increase. The thermal cycle parameters can be used to accelerate the process of thermal cycle experiment. And the study of dimension effect on thermal fatigue life gave optimization of the package structure","PeriodicalId":406794,"journal":{"name":"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.","volume":"92 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"The effect of accelerated thermal cycle parameters and the geometry dimensions on solder joint reliability\",\"authors\":\"Bingting Hu, Jie-min Zhou, P. Zhou, Yingge Yang\",\"doi\":\"10.1109/HDP.2006.1707600\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A simplified BGA flip chip model was established based on Ansys software to investigate thermal stress in the solder joints. The thermal cycle dwell time, thermal cycle temperature range and the maximum dwell temperature were changed to observe their effects on the thermal fatigue life of solder joint; the length and thickness of substrate were also changed to research the dimension effect. The thermal cycle lives were calculated and compared according to two different modified Coffin-Manson equations. The results indicate that the thermal fatigue life decreases with enlarging the thermal cycle dwell time, the thermal cycle range and the maximum dwell temperature. The fatigue life also decreases as the length and thickness of substrate increase. The thermal cycle parameters can be used to accelerate the process of thermal cycle experiment. And the study of dimension effect on thermal fatigue life gave optimization of the package structure\",\"PeriodicalId\":406794,\"journal\":{\"name\":\"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.\",\"volume\":\"92 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HDP.2006.1707600\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HDP.2006.1707600","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The effect of accelerated thermal cycle parameters and the geometry dimensions on solder joint reliability
A simplified BGA flip chip model was established based on Ansys software to investigate thermal stress in the solder joints. The thermal cycle dwell time, thermal cycle temperature range and the maximum dwell temperature were changed to observe their effects on the thermal fatigue life of solder joint; the length and thickness of substrate were also changed to research the dimension effect. The thermal cycle lives were calculated and compared according to two different modified Coffin-Manson equations. The results indicate that the thermal fatigue life decreases with enlarging the thermal cycle dwell time, the thermal cycle range and the maximum dwell temperature. The fatigue life also decreases as the length and thickness of substrate increase. The thermal cycle parameters can be used to accelerate the process of thermal cycle experiment. And the study of dimension effect on thermal fatigue life gave optimization of the package structure
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